TH511 10Hz-2MHz Semiconductor C-V Characteristic Analyzer CV
Analyzer
A DC Bias Current Source is an electronic device that provides a
constant and adjustable direct current (DC) to bias electronic
components and circuits. It is commonly used in various
applications where a DC bias is required, such as in the testing,
characterization, and calibration of electronic devices
Features
• 10.1-inch capacitive touch screen, resolution 1280*800, Linux
system
• Dual CPU architecture, the fastest test speed of LCR function is
0.56ms
• Three test methods: spot test, list scan, and graphic scan
(option)
• Four parasitic parameters (Ciss, Coss, Crss, Rg) are measured and
displayed on the same screen
• CV curve scan, Ciss-Rg curve scan
• Integrated design: LCR + VGS low voltage source + VDS high
voltage source + channel switching + PC
• Standard 2-channel test, which can test two devices or dual-chip
devices at the same time, the channel can be expanded to 6, channel
parameters are stored separately
• Fast charging, shortens capacitor charging time and enables fast
testing
• Automatic delay setting
• High Bias: VGS: 0 - ±40V, VDS: 0 - 200V/1500V/3000V
• 10 bin sorting
Applications
• Semiconductor components/Power components
Parasitic capacitance test and C-V characteristic analysis of
diodes, triodes, MOSFETs, IGBTs, thyristors, integrated circuits,
optoelectronic chips, etc.
• Semiconductor material
Wafer, C-V characteristic analysis
• Liquid crystal material
Elastic constant analysis
• Capacitive element
Capacitor C-V characteristic test and analysis, capacitive sensor
test and analysis
Specifications
| Model | TH511 | TH512 | TH513 |
| Channel | 2 (4/6 Ch Optional) | 2 |
| Display | Display | 10.1-inch capacitive touchscreen |
| Ratio | 0.672916667 |
| Resolution | 1280*RGB*800 |
| Test Parameter | Ciss, Coss, Crss, Rg. Four parameter selectable arbitrarily |
| Test Frequency | Range | 1kHz-2MHz |
| Accuracy | 0.0001 |
| Resolution | 10mHz 1.00000kHz-9.99999kHz |
| 100mHz 10.0000kHz-99.9999kHz |
| 1Hz 100.000kHz-999.999kHz |
| 10Hz 1.00000MHz-2.00000MHz |
| Test Level | Voltage Range | 5mVrms-2Vrms |
| Accuracy | ± (10%*Setting Value+2mV) |
| Resolution | 1mVrms 5mVrms-1Vrms |
| 10mVrms 1Vrms-2Vrms |
| Vgs | Range | 0 - ±40V |
| Accuracy | 1%* Setting Voltage+8mV |
| Resolution | 1mV 0V - ±10V |
| 10mV ±10V - ±40V |
| Vds | Range | 0 - 200V | 0 - 1500V | 0 - 3000V |
| Accuracy | 1%* Setting Voltage+100mV |
| Output Impedance | 100Ω, ±2%@1kHz |
| Computation | Absolute deviation Δ from nominal value, percent deviation from
nominal value Δ% |
| Calibration Function | OPEN, SHORT, LOAD |
| Measure Average | 1-255 times |
| AD Conversion Time (ms/time) | Fast+: 0.56ms (＞5kHz), Fast: 3.3ms, Middle: 90ms, Slow: 220ms. |
| Basic Accuracy | 0.001 |
| Ciss, Coss, Crss | 0.00001pF - 9.99999F |
| Rg | 0.001mΩ - 99.9999MΩ |
| Δ% | ±(0.000% - 999.9%) |
| Multi-Function Parameter List Scan | Spots | 20 spots, the average number can be set for each spot, and each
spot can be sorted separately |
| Parameter | Test Frequency, Vg, Vd, Channel |
| Trigger Mode | Sequence SEQ: After one trigger, measure at all sweep points,
/EOM/INDEX output only once.
Step: perform a sweep point measurement per trigger, each point
outputs /EOM/INDEX, but the list scan comparator result is only
output at the last /EOM |
| Graphic Scan | Scanning Spots | Any Spot is optional, up to 1001 Spots |
| Result Display | Multiple curves with the same parameter and different Vg;
multiple curves with the same Vg and different parameters. |
| Display Range | Real-time automatic, locked |
| Coordinate ruler | Logarithmic, linear |
| Parameter | Vg, Vd |
| Trigger Mode | Single | Manual trigger once, complete one scan from the start spot to the
end spot, and start a new scan with the next trigger signal |
| Continuous | Infinite loop scan from the start spot to the end spot |
| Result Storage | Graphics, files |
| Comparators | Bin | 10Bin, PASS, FAIL |
| Bin Deviation Setting | Deviation, Percent Deviation, Off |
| Bin Mode | Tolerance, continuous |
| Bin Count | 0-99999 |
| Bin Judgement | A maximum of four parameter limit ranges can be set for each bin.
The corresponding bin number will be displayed within the setting
range of the four test parameter results. If it exceeds the set
maximum bin number range, FAIL will be displayed. Test parameters
without upper and lower limits will be automatically ignored. |
| PASS/FAIL indication | Satisfy Bin1-10, the PASS light on the front panel is on, otherwise
the FAIL light is on. |
| Data Storage | 201 measurement results can be read in batches |
| Storage File | Internal | About 100M non-volatile memory test setup file |
| External USB | Test setup files, screenshots, log files |
| Keyboard Lock | Lockable front panel buttons, other functions to be expanded |
| Interface | USB HOST | 2 USB HOST interfaces, which can be connected to the mouse and
keyboard at the same time, and only one U disk can be used at the
same time |
| USB DEVICE | Universal Serial Bus socket, small type B (4 contact positions);
compliant with USB TMC-USB488 and USB2.0, female connector for
connecting external controllers. |
| LAN | 10/100M Ethernet, 8 pins, two speed options |
| HANDLER | Used for Bin signal output |
| RS232C | Standard 9-pin, crossed |
| RS485 | Can receive modification or external RS232 to RS485 module |
| Boot Warm-up Time | 60 Minutes |
| Input voltage | 100-120VAC/198-242VAC Option, 47-63Hz |
| Power consumption | More than 130VA |
| Dimensions (W*H*D) mm | 430*177*405 |
| Weight | 12kg |
Accessary
| Standard |
| Accessories name | Model | |
| Test Fixture | TH26063B | |
| Test Fixture | TH26063C | |
| TH510 fixture control connection cable | TH26063D | |
| TH510 Test Extension Cable | TH26063G | |
